1. Power mosfets: for commerical and high reliability applications
Author: / Harris semiconductor literature department
Library: Central library of medical university of Isfahan (Esfahan)
Subject: Metal oxide semiconductor field- effect transistors,Electronic circuits
Classification :
TK7871
.
95
.
P6
1994
2. Reliability of high mobility SiGe channel MOSFETs for future CMOS applications
Author: Franco, Jacopo, Jacopo Franco, Ben Kaczer, Guido Groeseneken
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: Reliability ، Metal oxide semiconductor field-effect transistors,Reliability ، Metal oxide semiconductors, Complementary,، Physics,، Semiconductors,، Circuits and Systems,، Optical and Electronic Materials,، Electronic Circuits and Devices
Classification :
TK7871
.
95
3. Transistor level modeling for analog/RF IC design
Author: / edited by Wladyslaw Grabinski, Bart Nauwelaers and Dominique Schreurs
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Metal oxide semiconductor field-effect transistors,Integrated circuits,Metal oxide semiconductors,Electronic books. , local
Classification :
E-BOOK
